posted on 2013-03-25, 00:00authored byMaksim Kunitski, Martin Richter, Mark D. Thomson, Arno Vredenborg, Jian Wu, Till Jahnke, Markus Schöffler, Horst Schmidt-Böcking, Hartmut G. Roskos, Reinhard Dörner
Originally published in Optics Express on 25 March 2013 (oe-21-6-6826)