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Media 5: Nanoscale roughness micromilled silica evanescent refractometer
journal contribution
posted on 2015-01-26, 00:00 authored by Lewis G. Carpenter, Peter A. Cooper, Christopher Holmes, Corin B. E. Gawith, James C. Gates, Peter G. R. SmithOriginally published in Optics Express on 26 January 2015 (oe-23-2-1005)