Continuous-wave terahertz system based on a dual-mode laser for real-time non-contact measurement of thickness and conductivity
Posted on 2017-04-28 - 16:35
Terahertz (THz) waves have been exploited for the non-contact measurements of thickness and refractive index, which has enormous industrial applicability. In this work, we demonstrate a 1.3-μm dual-mode laser (DML)-based continuous-wave THz system for the real-time measurement of a commercial indium-tin-oxide (ITO)-coated glass. The system is compact, cost-effective, and capable of performing broadband measurement within a second at the setting resolution of 1 GHz. The thickness of the glass and the sheet conductivity of the ITO film were successfully measured, and the measurements agree well with those of broadband pulse-based time domain spectroscopy and Hall measurement results.
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Moon, Kiwon; Kim, Namje; Shin, Jun-Hwan; Yoon, Young-Jong; Han, Sang-Pil; Park, Kyung Hyun (2014). Continuous-wave terahertz system based on a dual-mode laser for real-time non-contact measurement of thickness and conductivity. Optica Publishing Group. Collection. https://doi.org/10.6084/m9.figshare.c.3765284.v1