Statistical optics modeling of dark-field scattering in X-ray grating interferometers: Part 2. Simulation

Posted on 01.12.2021 - 20:31
A grating-based Talbot-Lau X-ray interferometer provides three imaging modalities, namely attenuation, differential phase contrast, and dark field. Of these, dark-field imaging is uniquely capable of detecting and characterizing micron-scale fine structure in an object via small-angle scattering that reduces fringe visibility. In Part 1 we formulate a statistical optics model that predicts the change in visibility, or dark-field signal, as a function of the statistical properties of the scattering object as well as its location within the interferometer. In Part 2 we demonstrate use of this model by simulating an object comprising a random collection of scattering microspheres placed in an X-ray grating interferometer designed to operate at 28 keV. The statistical optics results are validated by numerical Fourier optics simulations.

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Wilde, Jeff; Hesselink, Lambertus (2021): Statistical optics modeling of dark-field scattering in X-ray grating interferometers: Part 2. Simulation. Optica Publishing Group. Collection. https://doi.org/10.6084/m9.figshare.c.5702047.v3
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